Experience the New µCMM NEO Live for the First Time
Surface-First Metrology: From Measurement Data to Functional Understanding
Experience the next generation of optical dimensional metrology live at IMTS 2026 in Chicago.
The µCMM NEO goes beyond dimensional measurement—it delivers a complete understanding of function-critical features. Using full-field 3D measurement data, you can analyze dimensions, position, form, and surface roughness in a single measurement workflow and make more informed quality decisions.
✔ Surface First Metrology instead of isolated measurement data
✔ More insight instead of more measurement points
✔ Dimensions, position, form, and roughness in a single measurement run
✔ Complete 3D data for micro holes and complex micro features
✔ One platform instead of multiple measurement systems
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Dimensions Alone Are No Longer Enough
Many quality issues are not caused by dimensional deviations alone.
Surface characteristics, micro features, and manufacturing processes often determine how a part performs in the real world.
The Challenges
- Switching between multiple measurement systems
- Increasing inspection effort and complexity
- Delayed part release and production bottlenecks
- Quality issues discovered too late
Surface-First Metrology
Measure geometry, surface, and function-critical features in a single workflow—and gain the complete picture needed for confident quality decisions.

Surface-First Metrology.
Powered by µCMM NEO.
More Surface Insight. More Speed. More Accuracy.
The new µCMM NEO combines over 25 years of optical metrology expertise with a Surface-First approach that goes beyond dimensional inspection. Full-field 3D data provides a deeper understanding of micro features, freeform surfaces, and micro bores—helping manufacturers make faster and more confident quality decisions.
Key Benefits
✔ Dimensions, position, form, and roughness in one workflow
✔ One platform instead of multiple measurement systems
✔ Understand micro holes and geometries—not just measure them
✔ Gain deeper insight into function-critical features
Turn Your Measurement Data Into Better Manufacturing Decisions
The µCMM NEO helps you move beyond measurement and gain actionable quality insights.
With the µCMM NEO you can:
✓ Detect quality issues before they impact production
✓ Accelerate root cause analysis
✓ Simplify inspection workflows
✓ Improve manufacturing consistency
The Result
Reduced scrap
Higher process capability
Faster part release
One system. One workflow.
Your Industry. Your Measurement Challenge. Solved.
A Complete Portfolio for Manufacturing Quality
Not every measurement task requires the same technology.
Visit us at IMTS 2026 and discuss your application with our experts.
Together we will identify the solution that delivers the greatest value for your production.
Take a Sneak Peek of our Booth Highlights
Universal Solution for Form and Surface Finish Measurement
InfiniteFocus G6
Key Benefits
- Form and roughness measurement in one system
- CAD/PMI integration
- Automation-ready interfaces
- Offline measurement planning
- Operator-independent batch measurements
Powerful Optical 3D Measurements Directly on the Shop Floor
FocusX
Key Benefits
- Seamless inline and shop-floor measurements
- Reliable measurement of highly reflective surfaces
- Capture steep flanks and complex geometries
- Measure small radii, sharp edges, and tight tolerances
- Consistent results, even in high-volume production environments
Purpose-Built for Cutting Edge, Wear & Tool Measurement
InfiniteFocusSL
Key Benefits
- Capture form, roughness, and cutting edge characteristics in one measurement workflow
- Fast and traceable quality control
- Inspect complex tool geometries without contact
- Ideal for production and laboratory environments
Verify Surface Quality & Dimensional Accuracy of Small Features on Large Components
Cobots
Key Benefits
- Measure directly in production or on the machine tool
- Repeatable, high-resolution 3D measurements with full traceability
- Easy operation without metrology expertise
- Automated inspection workflows with instant OK/Not OK reporting
3 Reasons Why You Should Visit Us at IMTS
Experience the µCMM NEO Before Anyone Else
See how Surface-First Metrology helps manufacturers gain a deeper understanding of part quality and performance.
Bring Your Measurement Challenge
Discuss your application with our experts and discover the best solution for your production environment.
Discover a Smarter Approach to Quality Control
See how geometry, surface information, and manufacturing insight come together in a single workflow.

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