News > InfiniteFocus and MeX conform to new ISO norm 25178

InfiniteFocus and MeX conform to new ISO norm 25178

The new ISO Norm 25178 includes for the first time standardized parameters to classify optically area based measurements. As a member of the responsible ISO committee, WG 16, experts of Alicona Imaging played an important role in defining the classifications of methods for surface measurement techniques. Also, Alicona Imaging was involved in the final definition of surface parameters to be extracted.

Both, focus-variation which is the core of the optical measurement device InfiniteFocus, and the basic technique of MeX, are included in ISO 25178 as optical surface measurement techniques.

The new ISO norm includes several parameters to characterize surface measurement results. InfiniteFocus and MeX conform to the following:
  • Parameters to describe height-distribution
    Sa, Sq, Sp, Sv, Sz, Ssk, Sdq, Sdr
  • Parameters to describe areal material ratio
    Sk, Spk, Svk, Smr1, Smr2
  • Spatial parameters with auto correlation function, fourier spectrum and miscellaneous parameters
    Sal, Str, Std, Stdi
  • Parameters for material volume measurement
    Vmp, Vmc, Vvc, Vvv, Vvc/Vmc
  • Gradient distribution


InfiniteFocus and MeX conform to the following international norms
 
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3d micro-coordinate measurement technique for roughness and form measurement

Alicona offers optical 3d surface measurement systems for quality assurance in research and production. Core competence is the measurement of roughness and form also across large measurement areas and volumes. The cutting edge measurement and the measurement of small radii and angles are typical applications. Focus-Variation, the core technique of the InfiniteFocus line, combines the traditional surface metrology and the micro coordinate measurement technology. This technology achieves traceable and repeatable results in highest resolution even in production.