InfiniteFocus and MeX conform to new ISO norm 25178

The new ISO Norm 25178 includes for the first time standardized parameters to classify optically area based measurements. As a member of the responsible ISO committee, WG 16, experts of Alicona Imaging played an important role in defining the classifications of methods for surface measurement techniques. Also, Alicona Imaging was involved in the final definition of surface parameters to be extracted.

Both, focus-variation which is the core of the optical measurement device InfiniteFocus, and the basic technique of MeX, are included in ISO 25178 as optical surface measurement techniques.

The new ISO norm includes several parameters to characterize surface measurement results. InfiniteFocus and MeX conform to the following:

• Parameters to describe height-distribution
  Sa, Sq, Sp, Sv, Sz, Ssk, Sdq, Sdr
• Parameters to describe areal material ratio
  Sk, Spk, Svk, Smr1, Smr2
• Spatial parameters with auto correlation function, fourier spectrum and miscellaneous parameters
  Sal, Str, Std, Stdi
• Parameters for material volume measurement
  Vmp, Vmc, Vvc, Vvv, Vvc/Vmc
• Gradient distribution

 

InfiniteFocus and MeX conform to the following international norms